节点文献
Robustness Testing Method for Intelligent Electronic Devices
【作者】 H.T.Jiang; Y.Yang; W.Huang; Y.J.Guo;
【Author】 H.T.Jiang;Y.Yang;W.Huang;Y.J.Guo;Jiangsu Electric Power Company Research Institute;
【机构】 Jiangsu Electric Power Company Research Institute;
【摘要】 This paper presents a device robustness testing method based on abnormal messages(DRTMAM),in order to detect the cyber vulnerabilities for intelligent electronic devices(IEDs)in industry control syste
【Abstract】 This paper presents a device robustness testing method based on abnormal messages(DRTMAM),in order to detect the cyber vulnerabilities for intelligent electronic devices(IEDs) in industry control syst
【Key words】 Robustness Testing;
Genetic Algorithm;
Cyber Vulnerability;
【基金】 supported by Jiangsu Provincial Science Project of State Grid under Grant No.J2014033;Natural Science Foundation of Jiangsu Province,China under Grant No.BK20140114
- 【会议录名称】 Proceedings of the Asia-Pacific Electronics and Electrical Engineering Conference(EEEC 2014)
- 【会议名称】2014 Asia-Pacific Electronics and Electrical Engineering Conference(EEEC 2014)
- 【会议时间】2014-12-27
- 【会议地点】中国上海
- 【分类号】TN915.08
- 【主办单位】IFSA、河南科技大学、东北大学、逢甲大学、CRC Press/Balkema