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Robustness Testing Method for Intelligent Electronic Devices

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【作者】 H.T.JiangY.YangW.HuangY.J.Guo

【Author】 H.T.Jiang;Y.Yang;W.Huang;Y.J.Guo;Jiangsu Electric Power Company Research Institute;

【机构】 Jiangsu Electric Power Company Research Institute

【摘要】 This paper presents a device robustness testing method based on abnormal messages(DRTMAM),in order to detect the cyber vulnerabilities for intelligent electronic devices(IEDs)in industry control syste

【Abstract】 This paper presents a device robustness testing method based on abnormal messages(DRTMAM),in order to detect the cyber vulnerabilities for intelligent electronic devices(IEDs) in industry control syst

【基金】 supported by Jiangsu Provincial Science Project of State Grid under Grant No.J2014033;Natural Science Foundation of Jiangsu Province,China under Grant No.BK20140114
  • 【会议录名称】 Proceedings of the Asia-Pacific Electronics and Electrical Engineering Conference(EEEC 2014)
  • 【会议名称】2014 Asia-Pacific Electronics and Electrical Engineering Conference(EEEC 2014)
  • 【会议时间】2014-12-27
  • 【会议地点】中国上海
  • 【分类号】TN915.08
  • 【主办单位】IFSA、河南科技大学、东北大学、逢甲大学、CRC Press/Balkema
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